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Mots clés
Al2O3
Nuclear reaction analysis
Low energy electron diffraction LEED
17Opp
Photoluminescence
Adsorbed layers
Channeling
NRP
Rutherford backscattering spectrometry RBS
Atomic Layer Deposition ALD
Density functional theory
Silicon carbide
HfO2
XPS
2H
Growth
Capillary condensation
17Op
Transparent conductive oxide TCO
Metal-insulator transition
Ion beam analysis
Evaluation
13C
Kossel diffraction
Energy loss
XRD
Adsorption Isotherms
Indium oxide
Hysteresis
Periodic multilayer
Oxidation
Aluminum
Thin films
Interface defects
Pulsed laser deposition
7550Pp
27Alda
Diffusion
27Aldp
Acoustic propreties of solid
Multilayer
15N
Zinc oxide
Thin film
AC susceptibility
Acoustic
Gold
18O
Raman spectroscopy
SiC
Epitaxial growth
8140Ef
Nuclear resonance profiling NRP
Pb centers
Aluminium
18O resonance
Nickel
7630Lh
Topological insulators
Ferromagnetic resonance
Passivation
Stable isotopic tracing
27Ald p&α
Alloys
Defects
PIXE
Silicon
ALD
Nitridation
Magnetic anisotropy
Nanostructures
17O
Silicon Carbide
Auger electron spectroscopy AES
Gallium oxide
Sputtering
Annealing
Oxygen deficiency
Silica
RBS
Alloy
Isotopic Tracing
Charge exchange
Nanoparticles
Topological defects
Magnetization curves
Ion implantation
Epitaxy
ADSORPTION DESORPTION HYSTERESIS
Ageing
Measurement
Magnetic semiconductors
7550Ee
X-ray diffraction
EPR
GaMnAs
6855Jk
AFM
3C-SiC
Adsorption